Electron microbeam facility

Institution: 
University of Cardiff - Earth and Ocean Sciences
Equipment Type: Electron microscope

Our microscope can be used to image objects such as minerals and microfossils at a magnification far exceeding the capabilities of an optical microscope.

The Electron Microbeam facility in the School of Earth and Ocean Sciences houses two Scanning Electron Microscopes and an X-ray Diffractometer. The Scanning Electron Microscope (SEM) is used for characterization, imaging and analysis of sub-micron features in materials. The X-ray Diffractometer is used for identifying and characterizing minerals, either alone or in complex mixtures.

Our facilities include a state-of-the-art Zeiss Sigma HD Field Emission Gun Analytical SEM which is used for high-resolution imaging and X-ray element mapping as well as quantitative analysis of major, minor and trace elements. In addition our FEI XL30 Field Emission GunEnvironmental SEM is used for high-resolution imaging and semi-quantitative X-ray element analysis of samples. Carbon- and gold-coating facilities are available for non-conducting samples. The Philips PW1710 Automated Powder Diffractometer is used for identifying and characterizing minerals, either alone or in complex mixtures.

Contact Name: 
Duncan Muir
Number Held: 
1
Capability: 
Analytical Scanning Electron MicroscopeOur state-of-the-art Zeiss Sigma HD Field Emission Gun Analytical SEM (ASEM) is the flagship of our facility. The Schottky Thermal Field Emission Gun provides a stable beam that can be operated between 0.2 and 30 kV and 4 pA to 100 nA. As well as being used for high-resolution imaging, it is set up for rapid X-ray element mapping and quantitative analysis of elements.Environmental Scanning Electron MicroscopeThis is a high resolution SEM allowing magnifications up to 500,000x on conventional coated/conducting samples but it also has the capability for high resolution SEM of uncoated and even hydrated "wet" samples.
Available for use/hire by external contacts