Scanning electron microscope facility

The scanning electron microscope (SEM) facility allows the observation of inorganic and organic materials from the nanometer- through to the micrometer-scale. It uses electrons rather than light to form three-dimensional-like images of the surface of a wide range of geological, chemical and other materials.The Scanning Electron Microscope (SEM) facility was established in 2001, originally funded by NERC, the University of Southampton and Carl Zeiss SMT Ltd, to support high-resolution palaeoceanographical, palaeoclimatic and palaeoenvironmental research. The instrumentation includes a Leo 1450VP SEM and an Oxford Instruments X-Act 10mm2 area SDD EDS Detector, utilising the AZtec Energy software system.We offer an imaging and analytical service, including secondary electron and backscattered electron imaging, elemental mapping and qualitative and quantitative elemental spot analysis. Uncoated, beam and vacuum sensitive specimens may also be imaged or chemically analysed, by using the SEM variable pressu