Scanning Electron Microscopy

Our Hitachi S-3600N Environmental Scanning Electron Microscope is capable of producing high-resolution digital images of the surface structure of specimens, which, by virtue of the large specimen chamber, can range from powdered material and microfossils to 25 cm diameter bulk samples. A variable pressure mode allows the investigation of those non-conductive specimens which are not amenable to the application of a conductive coating. An Oxford INCA 350 EDX system provides the capability for elemental mapping and analysis.